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Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Artech House Integrated Microsystems)

All Categories > Engineering > Engineering - Electronics & Electrical > Circuits & Devices

Authors: Sudarshan Bahukudumbi, Krishnendu Chakrabarty
  • ISBN: 9781596939899
  • Price: LE 186.00
  • Special Offer Price: LE 148.80
  • Number Of Pages: 198
  • Edition: 1 Edition
  • Publication Date: 2010
  • Categories Circuits & Devices  
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